UFS Programming & Test System

High-efficiency automated platform for UFS chip programming and multi-site testing, supporting LPDDR200 balls, 221 balls, 254 balls, and 315 balls.

Operators load tray-packed chips into the feeding station. The system automatically handles tray replacement, stacking, and separates good and NG components. Test time is fully adjustable according to production requirements. Automatic communication allows quick product series change by switching the corresponding test fixtures.

The platform can be fully customized to meet specific testing software requirements. Test software can be provided by us or supplied by the client.

System Overview

This automated system integrates UFS programming and multi-site IC testing into a single workflow. Trays are automatically loaded, stacked, and separated into good and defective components. The system is compatible with a range of ball types and provides full flexibility for test duration and series change.

Fully customizable test software ensures the system can adapt to different production requirements and customer-specific needs.

Key System Features

• Automated UFS programming and multi-site IC testing
• Automatic tray handling with stacking and separation of NG components
• Adjustable test time and quick series change via dedicated fixtures
• Customizable test software (client-supplied or provided)
• CCD vision detection for component orientation verification
• Fully systemized operation for repeatability and reliability

Technical Specifications

Engineering Philosophy

Designed for efficiency, reliability, and repeatability, this system automates UFS programming and multi-site testing to reduce manual handling and improve production quality.

Modular design and standardized components ensure easy maintenance and allow customization to meet different customer production requirements.