32-Site Automated Test System

High-efficiency automated testing platform designed for multi-site IC component testing,
capable of handling LPDDR200 balls, 221 balls, 254 balls, and 315 balls.

Operators load tray-packed chips into the feeding station. The system automatically handles tray replacement, stacking, and separates good and NG components. Test time is adjustable and easily set according to production requirements. The system communicates automatically, and changing the product series only requires switching the corresponding test fixture.

Fully customizable test software is available, either provided by us or supplied by the customer.

System Overview

This automated testing system handles tray-loaded ICs, automatically replacing trays and stacking them while separating good and defective components. It supports a wide range of IC ball types and allows full control over test duration. Changing product series is quick and seamless with dedicated test fixtures.

The platform can be fully customized to meet specific testing software requirements, ensuring flexibility for different production environments.

Key System Features

• Automated tray handling and multi-site IC testing
• Automatic separation of good and NG components
• Adjustable test time and easy series change
• Customizable test software available (client-supplied or provided)
• Fiber-optic and CCD vision detection for component orientation verification
• Fully systemized operation for repeatability and reliability

Technical Specifications

Engineering Philosophy

Designed for efficiency, reliability, and repeatability, this
system automates tray handling and multi-site IC testing to reduce manual handling and improve production quality.

Modular design and standardized components ensure easy maintenance
and allow customization to meet different customer production requirements.